SCOPUS 정보 검색 플랫폼

Volumn 54, Issue 1-4, 2011, Pages 97-100

Surface roughness and structure of electrodeposited Cu2O layers on Si substrates

(7) Brandt, Iuri Stefani a Stenger, Vagner a Zoldan, Vinicius Cláudio a Acuña, José Javier Saéz a Da Silva, Douglas Langie b Viegas, Alexandre Da Cas a Pasa, André Avelino a

a FEDERAL UNIVERSITY OF SANTA CATARINA (Brazil)

b FEDERAL UNIVERSITY OF PELOTAS (Brazil)

Author keywords

Cuprous oxide; Electrodeposition; Roughness and structure

Indexed keywords

CUPROUS OXIDE; OPTICAL GAP; OPTICAL REFLECTANCE; REFRACTION INDEX; ROUGHNESS AND STRUCTURE; SI SUBSTRATES; SI(1 0 0); SI(111) SUBSTRATE;

ATOMIC FORCE MICROSCOPY; ELECTRODEPOSITION; LIGHT TRANSMISSION; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SUBSTRATES; SURFACE PROPERTIES; SURFACE STRUCTURE; TEXTURES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

SURFACE ROUGHNESS;

EID: 79951951137 PISSN: 10225528 EISSN: None Source Type: Journal
DOI: 10.1007/s11244-011-9629-6 Document Type: Conference Paper

Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.