Switching distributions and write reliability of perpendicular spin torque MRAM

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2010, Pages

  Worledge, D C ^a   Hu, G ^a   Trouilloud, P L ^a   Abraham, D W ^a   Brown, S ^a   Gaidis, M C ^a   Nowak, J ^a   O'Sullivan, E J ^a   Robertazzi, R P ^a   Sun, J Z ^a   Gallagher, W J ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR PROBABILITIES; IN-PLANE; MRAM ARRAYS; SPIN TORQUE; SWITCHING PROBABILITY; SWITCHING VOLTAGES;

ELECTRON DEVICES; PROBABILITY; SWITCHING;

TUNNEL JUNCTIONS;

EID: 79951831859     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2010.5703349     Document Type: Conference Paper

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