Modeling safety instrumented systems with MooN voting architectures addressing system reconfiguration for testing

Reliability Engineering and System Safety

Volumn 96, Issue 5, 2011, Pages 545-563

  Torres Echeverra, A C ^a   Martorell, S ^b   Thompson, H A ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b UNIVERSITAT POLITÈCNICA DE VALÈNCIA   (Spain)

Author keywords

Common cause failure; IEC 61508; k out of n; MooN; Probability of dangerous failure on demand; Safety integrity level; Safety system; Spurious trip rate

Indexed keywords

COMMON CAUSE FAILURE; IEC 61508; K-OUT-OF-N; SAFETY INTEGRITY LEVEL; SAFETY SYSTEM; SPURIOUS TRIP RATE;

ARCHITECTURE; MOON; MULTIOBJECTIVE OPTIMIZATION; PROBABILITY; REGULATORY COMPLIANCE; SAFETY ENGINEERING; SAFETY TESTING; SECURITY SYSTEMS; SURVEYING INSTRUMENTS; SYSTEMS ANALYSIS;

QUALITY ASSURANCE;

EID: 79951808962     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ress.2010.12.003     Document Type: Article

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