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Volumn 58, Issue 1, 1997, Pages 15-17

Reliability analysis of K-out-of-N: G systems with dependent failures and imperfect coverage

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; ENGINEERING; MARKOV PROCESSES; STATISTICAL METHODS;

EID: 0031248203     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0951-8320(97)00050-1     Document Type: Article
Times cited : (36)

References (6)
  • 1
    • 0022734032 scopus 로고
    • A measure-based model for workload dependence of CPU errors
    • Iyer, R. K. and Rosetti, D. P., A measure-based model for workload dependence of CPU errors. IEEE Transactions on Computers, 1986, C-35, 511-519.
    • (1986) IEEE Transactions on Computers , vol.C-35 , pp. 511-519
    • Iyer, R.K.1    Rosetti, D.P.2
  • 4
    • 0023164055 scopus 로고
    • A new approach to common cause failure
    • Hughes, R. P., A new approach to common cause failure. Reliability Engineering, 1987, 17, 211-236.
    • (1987) Reliability Engineering , vol.17 , pp. 211-236
    • Hughes, R.P.1
  • 5
    • 0026435410 scopus 로고
    • Reliability analysis of a high voltage system with dependent failures and imperfect coverage
    • Pham, H., Reliability analysis of a high voltage system with dependent failures and imperfect coverage. Reliability Engineering and System Safety, 1992, 37, 25-28.
    • (1992) Reliability Engineering and System Safety , vol.37 , pp. 25-28
    • Pham, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.