Characterization of surface acid sites in tin-silicalite-1 (Sn-MFI) molecular sieve by X-ray photoelectron spectroscopy

Microporous and Mesoporous Materials

Volumn 141, Issue 1-3, 2011, Pages 236-240

  Niphadkar, P S ^a   Patil, K R ^a   Joshi, P N ^a  

^a NATIONAL CHEMICAL LABORATORY   (India)

Author keywords

Lewis acidity; Pyridine chemisorption; SiO2 SnO 2 molar ratio; Sn MFI; XPS

Indexed keywords

DECONVOLUTING; HIGH RESOLUTION; LEWIS ACID SITE; LEWIS ACIDITY; MOLAR RATIO; PHOTOELECTRON PEAKS; SILICALITE-1; SN-MFI; SURFACE ACID SITES; XPS;

CHEMISORPTION; MOLECULAR SIEVES; PHOTONS; PYRIDINE; SIEVES; SILICATE MINERALS; SILICON COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

TIN;

EID: 79951775418     PISSN: 13871811     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micromeso.2010.10.036     Document Type: Article

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