Radio frequency readout of electrically detected magnetic resonance in phosphorus-doped silicon MOSFETs

Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD

Volumn , Issue , 2010, Pages 221-222

  Willems Van Beveren, L H ^a   Huebl, H ^a   Starrett, R P ^a   Morello, A ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

BIASING CONDITIONS; ELECTRICALLY DETECTED MAGNETIC RESONANCES; FIELD-EFFECT; HIGH BANDWIDTH; HYPERFINE LINES; LIQUID HELIUM TEMPERATURE; METAL-OXIDE; MOS-FET; MOSFETS; PHOSPHORUS-DOPED; RADIO FREQUENCIES; REFLECTOMETRY; SPIN RESONANCE; TIME-RESOLVED DETECTION;

FIELD EFFECT TRANSISTORS; MAGNETIC RESONANCE; MICROELECTRONICS; MOSFET DEVICES; PHOSPHORUS; RADIO; RADIO WAVES; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICES; SUPERFLUID HELIUM;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 79951746075     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/COMMAD.2010.5699750     Document Type: Conference Paper

References (2)

1. L. H. Willems van Beveren, H. Huebl, D. R. McCamey, T. Duty, A. J. Ferguson, R. G. Clark, and M. S. Brandt, "Broadband electrically detected magnetic resonance of phosphorus donors in a silicon field-effect transistor", Appl. Phys. Lett. 93, pp. 0721021-3, August 2008.
2. H. Huebl, R. P. Starrett, D. R. McCamey, A. J. Ferguson, and L. H. Willems van Beveren, "Electrically detected magnetic resonance using radio-frequency reffectometry", Rev. Sci. lnstrum. 80, pp. 1147051 -4, November 2009.