Scanning electron microscopy and atomic force microscopy of chitosan composite films

Journal of the Chilean Chemical Society

Volumn 55, Issue 3, 2010, Pages 352-354

  Galo, Cárdenas ^a   Anaya, Paola ^a   Del Rio, Rodrigo ^b   Schrebler, Ricardo ^b   Von Plessing, Carlos ^a   Schneider, Mark ^c  

^a UNIVERSITY OF CONCEPCIÓN   (Chile)

^b PONTIFICIA UNIVERSIDAD CATÓLICA DE VALPARAÍSO   (Chile)

^c SAARLAND UNIVERSITY   (Germany)

Author keywords

Chitosan; Composite film; Morphology; Rugosity

Indexed keywords

EID: 79951621265     PISSN: 07179324     EISSN: 07179707     Source Type: Journal    
DOI: 10.4067/s0717-97072010000300017     Document Type: Article

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