Effects of bending fatigue on the electrical resistance in metallic films on flexible substrates

Metals and Materials International

Volumn 16, Issue 6, 2010, Pages 947-951

  Lee, Ho Young ^a   Yi, Seol Min ^a   Lee, Ji Hoon ^a   Lee, Hwan Soo ^b   Hyun, Seungmin ^c   Joo, Young Chang ^a  

^a Seoul National University   (South Korea)

^b Samsung Electro Mechanics   (South Korea)

^c Korea Institute of Machine and Materials   (South Korea)

Author keywords

Defects; Fatigue; Microstructure; Porous materials; Thin film

Indexed keywords

DEFECTS; ELECTRIC RESISTANCE; GRAIN BOUNDARIES; METALLIC FILMS; MICROSTRUCTURE; POROUS MATERIALS; SUBSTRATES; THIN FILMS;

BOUNDARY GEOMETRY; CYCLIC DEFORMATIONS; ELECTRICAL RESISTANCES; FLEXIBLE SUBSTRATE; POROUS MICROSTRUCTURE; POROUS STRUCTURES; SHORT DIFFUSION LENGTHS; STRAIN-CONTROLLED;

FATIGUE OF MATERIALS;

EID: 79951586722     PISSN: 15989623     EISSN: 20054149     Source Type: Journal    
DOI: 10.1007/s12540-010-1213-2     Document Type: Article

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