High-resolution in-situ characterization of the surface evolution of a polycrystalline NiTi SMA-alloy under pseudoelastic deformation

Materials Characterization

Volumn 62, Issue 3, 2011, Pages 298-303

  Lackmann, J ^a   Niendorf, T ^a   Maxisch, M ^a   Grundmeier, G ^a   Maier, H J ^a  

^a UNIVERSITY OF PADERBORN   (Germany)

Author keywords

CLSM; EBSD; Grain interaction; Phase transformation; Surface topography

Indexed keywords

CLSM; CONFOCAL LASER SCANNING MICROSCOPY; DEFECT FORMATION; DIGITAL IMAGE CORRELATIONS; EBSD; ELECTRON BACK SCATTER DIFFRACTION; GRAIN INTERACTION; GRAIN ORIENTATION; HIGH RESOLUTION; IN-SITU; IN-SITU CHARACTERIZATION; LOCAL STRAINS; MICRO-SCALES; MICROSTRUCTURAL FEATURES; NITI SMA; PHASE TRANSFORMATION; POLYCRYSTALLINE; PSEUDOELASTIC DEFORMATION; SURFACE EVOLUTION; THIN PROTECTIVE COATINGS; TOPOGRAPHICAL CHANGES; TOPOGRAPHICAL EVOLUTION;

CONFOCAL MICROSCOPY; MICROSTRUCTURAL EVOLUTION; PHASE TRANSITIONS; PROTECTIVE COATINGS;

SURFACE TOPOGRAPHY;

EID: 79951574684     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2010.12.008     Document Type: Article

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