Optimization and characterization of a highly-efficient diffraction nanograting for MHz XUV pulses

Optics Express

Volumn 19, Issue 3, 2011, Pages 1954-1962

  Yang, Ying Ying ^a,b,c   Süßmann, Frederik ^a,d   Zherebtsov, Sergey ^a   Pupeza, Ioachim ^a,d   Kaster, Jan ^a,d   Lehr, Dennis ^e   Fuchs, Hans Jörg ^e   Kley, Ernst Bernhard ^e   Fill, Ernst ^a,d   Duan, Xuan Ming ^b   Zhao, Zhen Sheng ^b   Krausz, Ferenc ^a,d   Stebbings, Sarah L ^a   Kling, Matthias F ^a  

^a MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

^b TECHNICAL INSTITUTE OF PHYSICS AND CHEMISTRY   (China)

^c UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

^d UNIVERSITY OF MUNICH   (Germany)

^e FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION;

BLAZED GRATING; EXTREME ULTRAVIOLETS; NANOGRATING; NONLINEAR EFFECT; REFLECTIVE MIRRORS; RIGOROUS COUPLED WAVE ANALYSIS; XUV PULSE;

OPTIMIZATION;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; NANOTECHNOLOGY; REFRACTOMETRY; SIGNAL PROCESSING; ULTRAVIOLET RADIATION;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; NANOTECHNOLOGY; REFRACTOMETRY; SIGNAL PROCESSING, COMPUTER-ASSISTED; ULTRAVIOLET RAYS;

EID: 79851501548     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.001954     Document Type: Article

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