A new approach to simulate characterization of particulate matter employing support vector machines

Journal of Hazardous Materials

Volumn 186, Issue 2-3, 2011, Pages 1254-1262

  Mogireddy, K ^a   Devabhaktuni, V ^a   Kumar, A ^b   Aggarwal, P ^a   Bhattacharya, P ^c  

^a UNIVERSITY OF TOLEDO   (United States)

^b The University of Toledo   (United States)

^c University of Cincinnati   (United States)

Author keywords

Image processing; Particulate matter (PM); Scanning electron microscope (SEM); Support vector machines (SVMs)

Indexed keywords

DETRIMENTAL EFFECTS; ESSENTIAL COMPONENT; FINE PARTICULATE MATTER; HUMAN HEALTH; IMAGE FEATURES; IMAGE PROCESSING ALGORITHM; MACHINE-LEARNING; NEW APPROACHES; OPTIMAL IMAGES; OPTIMAL SEGMENTATION ALGORITHM; PARTICULATE MATTER; PARTICULATE MATTER (PM); PHYSICAL CHARACTERIZATION; SCANNING ELECTRON MICROSCOPE (SEM); SEGMENTATION ALGORITHMS; SOBEL EDGE DETECTION;

ALGORITHMS; EDGE DETECTION; ELECTRON MICROSCOPES; FEATURE EXTRACTION; IMAGING SYSTEMS; KNOWLEDGE BASED SYSTEMS; OPTIMIZATION; SCANNING ELECTRON MICROSCOPY; SUPPORT VECTOR MACHINES; VECTORS;

IMAGE SEGMENTATION;

ALGORITHM; IMAGE PROCESSING; PARTICULATE MATTER; SCANNING ELECTRON MICROSCOPY; SEGMENTATION; VECTOR;

ALGORITHM; ARTICLE; AUTOMATION; CHEMICAL ANALYSIS; COMPUTER PROGRAM; CONCEPTUAL FRAMEWORK; EXTRACTION; IMAGE ANALYSIS; IMAGE PROCESSING; INTERMETHOD COMPARISON; NOSE; PARTICLE SIZE; PARTICULATE MATTER; SCANNING ELECTRON MICROSCOPY; SUPPORT VECTOR MACHINE; THROAT; VALIDATION PROCESS;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; COMPUTER SIMULATION; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON, SCANNING; PARTICLE SIZE; PARTICULATE MATTER;

EID: 79751536040     PISSN: 03043894     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jhazmat.2010.11.129     Document Type: Article

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