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Volumn 102, Issue 1, 2011, Pages 3-5

Observation of stacking faults in a scanning electron microscope by electron channelling contrast imaging

Author keywords

ECCI; Stacking fault; TRIP steel

Indexed keywords

AUSTENITIC MATRIX; BEAM CURRENTS; CYCLIC DEFORMATIONS; DEFORMATION BAND; ECCI; ELECTRON CHANNELLING CONTRAST IMAGING; FIELD EMISSION GUNS; SCANNING ELECTRON MICROSCOPE; TRIP-STEEL;

EID: 79551691605     PISSN: 18625282     EISSN: None     Source Type: Journal    
DOI: 10.3139/146.110448     Document Type: Article
Times cited : (11)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.