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Volumn 102, Issue 1, 2011, Pages 3-5
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Observation of stacking faults in a scanning electron microscope by electron channelling contrast imaging
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Author keywords
ECCI; Stacking fault; TRIP steel
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Indexed keywords
AUSTENITIC MATRIX;
BEAM CURRENTS;
CYCLIC DEFORMATIONS;
DEFORMATION BAND;
ECCI;
ELECTRON CHANNELLING CONTRAST IMAGING;
FIELD EMISSION GUNS;
SCANNING ELECTRON MICROSCOPE;
TRIP-STEEL;
DEFORMATION;
ELECTRON MICROSCOPES;
ELECTRONS;
FIELD EMISSION;
IMAGING TECHNIQUES;
SCANNING ELECTRON MICROSCOPY;
STACKING FAULTS;
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EID: 79551691605
PISSN: 18625282
EISSN: None
Source Type: Journal
DOI: 10.3139/146.110448 Document Type: Article |
Times cited : (11)
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References (10)
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