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Journal of Applied Physics

Volumn 109, Issue 2, 2011, Pages

Study of field emission, electrical transport, and their correlation of individual single CuO nanowires

(5) Shao, Pengrui a Deng, Shaozhi a Chen, Jun a Chen, Jian a Xu, Ningsheng a

a SUN YAT SEN UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED ELECTRIC FIELD; BENDING BEHAVIOR; ELECTRICAL TRANSPORT; ELECTRICAL TRANSPORT MEASUREMENTS; ENERGY BANDGAPS; FERMI ENERGY LEVELS; FN PLOTS; FOWLER-NORDHEIM PLOTS; P TYPE SEMICONDUCTOR; P-TYPE; THERMAL OXIDATION; X-RAY PHOTOELECTRON SPECTROSCOPY STUDIES;

ELECTRIC FIELDS; FIELD EMISSION; NANOWIRES; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRIC WIRE;

EID: 79551676279 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3536478 Document Type: Article

Times cited : (25)

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