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Volumn 20, Issue 3, 2011, Pages 290-293
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Microstructure and through-film electrical characteristics of vertically aligned amorphous carbon films
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Author keywords
Amorphous carbon; Electrical conductivity; Electrical properties characterization; Graphite
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Indexed keywords
ANNEALED FILMS;
DEPOSITION TEMPERATURES;
ELECTRICAL CHARACTERISTIC;
ELECTRICAL CONDUCTIVITY;
ELECTRICAL PROPERTIES CHARACTERIZATION;
ELECTRICAL PROPERTY;
ELECTRON TRANSPORT;
GRAPHITIC PLANES;
IN-SITU;
IN-SITU ANNEALING;
NANO CHANNELS;
PREFERRED ORIENTATIONS;
ROOM TEMPERATURE;
SUBSTRATE BIAS;
TWO-POINT;
VERTICAL DIRECTION;
VERTICALLY ALIGNED;
AMORPHOUS CARBON;
AMORPHOUS FILMS;
ANNEALING;
ELECTRIC CONDUCTIVITY;
GRAPHITE;
MICROSTRUCTURE;
TRANSMISSION ELECTRON MICROSCOPY;
CARBON FILMS;
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EID: 79551572802
PISSN: 09259635
EISSN: None
Source Type: Journal
DOI: 10.1016/j.diamond.2011.01.010 Document Type: Article |
Times cited : (20)
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References (21)
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