Health monitoring of electronic products based on Mahalanobis distance and Weibull decision metrics

Microelectronics Reliability

Volumn 51, Issue 2, 2011, Pages 279-284

  Niu, Gang ^a   Singh, Satnam ^b   Holland, Steven W ^c   Pecht, Michael ^a,d  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

^b India Science Lab   (India)

^c Electrical and Controls Integration Lab   (United States)

^d UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA SETS; ELECTRONIC PRODUCT; HEALTH INDICES; HEALTH MONITORING; HEALTH MONITORING SYSTEM; MAHALANOBIS DISTANCES; NOTE-BOOK COMPUTER; OPERATING PARAMETERS; WEIBULL;

HEALTH; LAPTOP COMPUTERS;

WEIBULL DISTRIBUTION;

EID: 79551499601     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2010.09.009     Document Type: Conference Paper

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