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Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 6, Issue SUPPL. 2, 2009, Pages

Off-angle dependence of void formation and defect behavior in a -plane MOVPE-GaN on r -plane sapphire substrate

(8) Kuwano, Noriyuki a Fukushima, Atsuhito a Kugiyama, Yuta a Ezaki, Tetsuya a Minami, Masahiro b Araki, Masahiko b Hoshino, Katsuyuki a Tadatomo, Kazuyuki b

a KYUSHU UNIVERSITY (Japan)

b YAMAGUCHI UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

A-PLANE; ATOMIC STEP; CRYSTALLOGRAPHIC ORIENTATION RELATIONSHIPS; GAN THIN FILMS; METALORGANIC VAPOR PHASE EPITAXY; MOVPE; NUCLEATION SITES; OFF-ANGLE; PLANE SAPPHIRE; SAPPHIRE SUBSTRATES; SIDE WALLS; SUBSTRATE PLANES; TEM OBSERVATIONS; TRANSMISSION ELECTRON MICROSCOPE; VOID FORMATION;

DEFECTS; GALLIUM NITRIDE; GRAIN BOUNDARIES; METALLORGANIC VAPOR PHASE EPITAXY; NUCLEATION; SAPPHIRE; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

GALLIUM ALLOYS;

EID: 79251639134 PISSN: 18626351 EISSN: 16101642 Source Type: Journal
DOI: 10.1002/pssc.200880884 Document Type: Article

Times cited : (4)

References (8)

1
- 0034710677
- (London)
- P. Walterelt, O. Brandt, A. Trampert, H. T. Grahn, J. Mennlger, M. Ramstelner, M. Relche, and K. H. Ploog, Nature (London) 406, 865 (2000).
- (2000) Nature , vol.406 , pp. 865
- Walterelt, P.¹ Brandt, O.² Trampert, A.³ Grahn, H.T.⁴ Mennlger, J.⁵ Ramstelner, M.⁶ Relche, M.⁷ Ploog, K.H.⁸

2
- 2542504545
- A. Chitnis, C. Chen, V. Adivarahan, M. Shatalov, E. Kuokstis, V. Mandavilli, J. Yang, and M. A. Khan, Appl. Phys. Lett. 84, 3663 (2004).
- (2004) Appl. Phys. Lett , vol.84 , pp. 3663
- Chitnis, A.¹ Chen, C.² Adivarahan, V.³ Shatalov, M.⁴ Kuokstis, E.⁵ Mandavilli, V.⁶ Yang, J.⁷ Khan, M.A.⁸

3
- 0042855995
- F. Wu, M. D. Craven, S.-H. Lim, and J. S. Speck, J. Appl. Phys. 94, 942 (2003).
- (2003) J. Appl. Phys , vol.94 , pp. 942
- Wu, F.¹ Craven, M.D.² Lim, S.-H.³ Speck, J.S.⁴

4
- 34547878769
- M. Araki, N. Mochimizo, K. Hoshino, and K. Tadatomo, Jpn. J. Appl. Phys. 46, 555 (2007).
- (2007) Jpn. J. Appl. Phys , vol.46 , pp. 555
- Araki, M.¹ Mochimizo, N.² Hoshino, K.³ Tadatomo, K.⁴

5
- 38549125464
- M. Araki, N. Mochimizo, K. Hoshino, and K. Tadatomo, Jpn. J. Appl. Phys. 47, 119 (2008).
- (2008) Jpn. J. Appl. Phys , vol.47 , pp. 119
- Araki, M.¹ Mochimizo, N.² Hoshino, K.³ Tadatomo, K.⁴

6
- 0003598030
- (Butterworths, London)
- P. B. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley, and M. J. Whelan, Electron Microscopy of Thin Crystals (Butterworths, London, 1965), p. 14.
- (1965) Electron Microscopy of Thin Crystals
- Hirsch, P.B.¹ Howie, A.² Nicholson, R.B.³ Pashley, D.W.⁴ Whelan, M.J.⁵

7
- 0034274772
- X. O. Shen, T. Ide, S. H. Cho, M. Shimizu, S. Hara, H. Okumura, S. Sonoda, and S. Shimizu, J. Cryst. Growth 218, 155 (2000).
- (2000) J. Cryst. Growth , vol.218 , pp. 155
- Shen, X.O.¹ Ide, T.² Cho, S.H.³ Shimizu, M.⁴ Hara, S.⁵ Okumura, H.⁶ Sonoda, S.⁷ Shimizu, S.⁸

8
- 0016557305
- J. K. Liu, K. M. Lakin, and K. L. Wang, J. Appl. Phys. 46, 3703 (1975).
- (1975) J. Appl. Phys , vol.46 , pp. 3703
- Liu, J.K.¹ Lakin, K.M.² Wang, K.L.³

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