High-performance uncooled amorphous silicon VGA and XGA IRFPA with 17μm pixel-pitch

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7834, Issue , 2010, Pages

  Tissot, J L ^a   Tinnes, S ^a   Durand, A ^a   Minassian, C ^a   Robert, P ^a   Vilain, M ^a  

^a ULIS   (France)

Author keywords

Amorphous silicon; IRFPA; LWIR; Uncooled microbolometer

Indexed keywords

COMPACT SYSTEM; DETECTOR CONFIGURATION; DYNAMIC RANGE; ELECTRO-OPTICAL PERFORMANCE; HIGH END PRODUCTS; HIGH RESOLUTION; HIGH SPATIAL RESOLUTION; HIGH-RESOLUTION IMAGING; IRFPA; LOW-POWER CONSUMPTION; LWIR; PIXEL PITCH; SERIAL LINK; SILICON TECHNOLOGIES; TECHNOLOGY NODES; THERMAL DYNAMICS; THERMAL TIME CONSTANTS; UNCOOLED; UNCOOLED MICROBOLOMETERS; PERFORMANCE ENHANCEMENTS; PRODUCT CATALOGS;

BOLOMETERS; INFRARED DEVICES; INFRARED RADIATION; PIXELS; TECHNOLOGY; TEMPERATURE SENSORS;

AMORPHOUS SILICON;

EID: 79251606864     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.864867     Document Type: Conference Paper

References (4)

1. "Latest amorphous silicon microbolometer development at LETI/LIR", J.J. Yon, E. Mottin, J.L. Tissot, Infrared technology and Applications XXXIV, proc. of SPIE Vol. 6940, (2008)
2. "Uncooled amorphous silicon TEC-less 1/4 VGA IRFPA with 25 μ m pixel-pitch for high volume applications", C. Minassian, J.L. Tissot, M. Vilain, O. Legras, S. Tinnes, B. Fieque, J.M Chiappa, P. Robert, Infrared Technology and Applications XXXIV, proc. of SPIE Vol.6940 (2008)
3. "High-performance uncooled amorphous silicon TEC less XGA IRFPA with 17μm pixel-pitch", C. Trouilleau, B. Fièque, S. Noblet, F. Giner, D. Pochic, A. Durand, P. Robert, S. Cortial, M. Vilain, J.L. Tissot, JJ. Yon, Infrared Technology and Applications XXXV, proc. of SPIE Vol.7298 (2009)
4. "VOX based uncooled microbolometric detector: Recent development at SCD", A. Fraenkel, U. Mizrahi, L. Bykov, A. Adin, D. Seter, A. Giladi, E. Malkinson, Y. Gebil, Z. Kopolovich, Infrared Technology and Applications XXXII, proc. of SPIE Vol.6206 (2006)