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Volumn 106, Issue 4, 2011, Pages

Detailed mapping of the local Ir4+ dimers through the metal-insulator transitions of CuIr2S4 thiospinel by x-ray atomic pair distribution function measurements

(5) Bozin E S a Masadeh, A S b,c Hor, Y S d,f Mitchell, J F d Billinge, S J L a,e

a BROOKHAVEN NATIONAL LABORATORY (United States)

b MICHIGAN STATE UNIVERSITY (United States)

c UNIVERSITY OF JORDAN (Jordan)

d ARGONNE NATIONAL LABORATORY (United States)

e Department of Earth and Environmental Sciences (United States)

f MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PAIR DISTRIBUTION FUNCTIONS; CR-DOPING; METAL-INSULATOR PHASE TRANSITION; METALLIC PHASE; METALLIC STATE; STRUCTURAL SIGNATURES; X RAY BEAM; X RAY IRRADIATION; X-RAY FLUENCE;

CHROMIUM; DIMERS; IRIDIUM; METAL INSULATOR BOUNDARIES; METAL INSULATOR TRANSITION; SEMICONDUCTOR INSULATOR BOUNDARIES; X RAYS;

DISTRIBUTION FUNCTIONS;

EID: 79251532094 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.106.045501 Document Type: Article

Times cited : (36)

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