X-ray topography of diamond using forbidden reflections: Which defects do we really see?

Journal of Applied Crystallography

Volumn 44, Issue 1, 2011, Pages 65-72

  Shiryaev, Andrei A ^a   Masiello, Fabio ^b   Hartwig, Jurgen ^b   Kupriyanov, Igor N ^c   Lafford, Tamzin A ^b   Titkov, Sergey V ^d   Palyanov, Yuri N ^c,e  

^a FRUMKIN INSTITUTE OF PHYSICAL CHEMISTRY AND ELECTROCHEMISTRY   (Russian Federation)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c SOBOLEV INSTITUTE OF GEOLOGY AND MINERALOGY   (Russian Federation)

^d INSTITUTE OF GEOLOGY OF ORE DEPOSITS   (Russian Federation)

^e NOVOSIBIRSK STATE UNIVERSITY   (Russian Federation)

Author keywords

diamond; forbidden reflections; nitrogen; point and extended defects; X ray topography

Indexed keywords

EXTENDED DEFECT; FORBIDDEN REFLECTIONS; LATTICE IMPERFECTION; STRESS FIELD; STRUCTURE FACTORS; X-RAY TOPOGRAPHY;

DIAMONDS; POINT DEFECTS; SYNTHETIC DIAMONDS; TOPOGRAPHY; X RAYS;

DEFECTS;

EID: 79251522483     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889810049599     Document Type: Article

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