Cloaking apertureless near-field scanning optical microscopy tips

Optics Letters

Volumn 36, Issue 2, 2011, Pages 211-213

  Bilotti, Filiberto ^a   Tricarico, Simone ^a   Pierini, Francesco ^a   Vegni, Lucio ^a  

^a ROMA TRE UNIVERSITY   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT SCATTERING; OPTICAL DATA STORAGE; OPTICAL MICROSCOPY; PLASMONS; PROBES; SIGNAL TO NOISE RATIO; SILICON CARBIDE;

COVERING MATERIAL; IR FREQUENCIES; METALLIC-TIP PROBES; WORKING FREQUENCY; ZERO VALUES;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 79251518626     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.36.000211     Document Type: Article

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