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Volumn 107, Issue 9, 2010, Pages

Influence of 190 MeV Ag+15 ion irradiation on electrical transport and magnetic properties of LaFe1-x Nix O3 (x=0.3 and 0.4) thin films

(7) Khan, M Wasi a Khan, M A Majeed a Alhoshan, Mansour a Alsalhi, M S a Aldwayyan, A S a Kumar, Ravi b Husain, Shahid c

a KING SAUD UNIVERSITY (Saudi Arabia)

b INTER UNIVERSITY ACCELERATOR CENTRE (India)

c ALIGARH MUSLIM UNIVERSITY (India)

Author keywords

[No Author keywords available]

Indexed keywords

C-AXIS ORIENTATIONS; ELECTRICAL TRANSPORT; FERROMAGNETIC BEHAVIORS; HYSTERESIS MEASUREMENTS; ION IRRADIATION; IRRADIATED FILMS; IRRADIATED SAMPLES; MAGNETIC MEASUREMENTS; PULSED-LASER DEPOSITION TECHNIQUE; SEMICONDUCTING BEHAVIOR; STRAIN-RELAXED; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE; TEMPERATURE-DEPENDENT RESISTIVITY; VARIABLE RANGE HOPPING;

DIFFRACTION; IRRADIATION; LANTHANUM ALLOYS; MAGNETIC PROPERTIES; PULSED LASER DEPOSITION; SEMICONDUCTING FILMS; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

ELECTRIC PROPERTIES;

EID: 79251495441 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3400036 Document Type: Article

Times cited : (3)

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