Electrical transport and 1/f noise properties of LaFe1-xNi xO3 (x = 0.3, 0.4 and 0.5) thin films

Journal of Physics D: Applied Physics

Volumn 41, Issue 17, 2008, Pages

  Khan, M Wasi ^a   Kumar, Ravi ^b   Choudhary, R J ^c   Srivastava, J P ^a   Patil, S I ^d   Choi, W K ^e  

^a ALIGARH MUSLIM UNIVERSITY   (India)

^b INTER UNIVERSITY ACCELERATOR CENTRE   (India)

^c University Campus ^*  (India)

^d UNIVERSITY OF PUNE   (India)

^e Korea Institute of Science and Technology   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 54749109509     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/41/17/175409     Document Type: Article

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