Infrared monitoring of diamond metalization

Applied Spectroscopy

Volumn 65, Issue 1, 2011, Pages 105-107

  Lovrinčić, Robert ^a   Noebel, Sebastian ^a   Pucci, Annemarie ^a  

^a UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

Electronic properties of thin films; Infrared spectroscopy; Metal diamond interfaces; Thin film growth

Indexed keywords

ALUMINUM FILM; CONTINUOUS LAYERS; DC CONDUCTIVITY; DIAMOND CRYSTALS; GROWTH MECHANISMS; HIGH SUBSTRATE TEMPERATURE; INFRARED SPECTRUM; METAL FILM; METAL-DIAMOND INTERFACES; METALIZATIONS; MORPHOLOGICAL PROPERTIES; ULTRA-HIGH; ULTRATHIN METAL LAYERS;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CHROMIUM; DIAMONDS; ELECTRONIC PROPERTIES; INFRARED SPECTROSCOPY; METALLIC FILMS; METALS; SINGLE CRYSTALS; THIN FILMS;

FILM GROWTH;

EID: 79251470150     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/10-06081     Document Type: Article

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