Elemental analysis of printed circuit boards considering the ROHS regulations

Waste Management

Volumn 31, Issue 3, 2011, Pages 530-535

  Wienold, Julia ^a   Recknagel, Sebastian ^a   Scharf, Holger ^a   Hoppe, Marion ^a   Michaelis, Matthias ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL RESULTS; ELECTRICAL AND ELECTRONIC EQUIPMENT; ELEMENTAL ANALYSIS; EUROPEAN PARLIAMENT; HEXAVALENT CHROMIUM; ICP-OES; MASS FRACTION; POLYBROMINATED BIPHENYLS; POLYBROMINATED DIPHENYL ETHERS; RELATIVE STANDARD DEVIATIONS; REPRODUCIBILITIES; ROHS COMPLIANCE; ROHS DIRECTIVE; SAMPLE PREPARATION; SAMPLE PRETREATMENT; SAMPLE PROCESSING; SAMPLE TREATMENT; SIZE REDUCTIONS;

AMPLIFIERS (ELECTRONIC); CADMIUM; CHROMIUM; COMPUTER SCIENCE; DECISION MAKING; DISSOLUTION; ETHERS; FLAME RETARDANTS; HAZARDOUS MATERIALS; LEAD; MERCURY (METAL); OSCILLATORS (ELECTRONIC); PERSONAL COMPUTERS; PRINTED CIRCUIT MANUFACTURE;

PRINTED CIRCUIT BOARDS;

CADMIUM; LEAD; MERCURY;

CUTTING; DISSOLUTION; ELECTRONIC EQUIPMENT; EUROPEAN UNION; MILLING; PARTICLE SIZE; PBDE; PRECISION; X-RAY FLUORESCENCE;

ACCURACY; ARTICLE; COLD VAPOR ATOMIC FORCE SPECTROMETRY; COMPUTER; CONTROLLED STUDY; DISSOLUTION; ENVIRONMENTAL PROTECTION; EUROPEAN UNION; GOVERNMENT REGULATION; INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETRY; MASS SPECTROMETRY; NEUTRON ACTIVATION ANALYSIS; PARTICLE SIZE; PRINTED CIRCUIT BOARD; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; REPRODUCIBILITY; SPECTROMETRY; X RAY FLUORESCENCE;

COMPUTERS; ENVIRONMENTAL POLLUTION; EUROPEAN UNION; FLAME RETARDANTS; HALOGENATED DIPHENYL ETHERS; METALS, HEAVY; PARTICLE SIZE; POLYBROMINATED BIPHENYLS; SPECTROMETRY, X-RAY EMISSION; SPECTROPHOTOMETRY, ATOMIC;

EID: 79151477095     PISSN: 0956053X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.wasman.2010.10.002     Document Type: Article

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