Room-temperature sub-diffraction-limited plasmon laser by total internal reflection

Nature Materials

Volumn 10, Issue 2, 2011, Pages 110-113

  Ma, Ren Min ^a   Oulton, Rupert F ^a   Sorger, Volker J ^a   Bartal, Guy ^a   Zhang, Xiang ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL STORAGE; LIGHT AMPLIFIERS; METALS; OPTICAL COMMUNICATION; OPTICAL DATA STORAGE; PHOTOLITHOGRAPHY; PLASMONS; REFRACTIVE INDEX; SEMICONDUCTOR LASERS;

CAVITY QUALITY FACTOR; CRYOGENIC TEMPERATURES; DIFFRACTION LIMITS; ROOM TEMPERATURE SEMICONDUCTORS; SINGLE MODE LASING; SPONTANEOUS EMISSION RATES; STRUCTURAL GEOMETRY; TOTAL INTERNAL REFLECTIONS;

DIFFRACTION;

EID: 79151477026     PISSN: 14761122     EISSN: 14764660     Source Type: Journal    
DOI: 10.1038/nmat2919     Document Type: Article

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