Diffuse X-ray scattering from graded SiGe/Si layers

EPL

Volumn 82, Issue 6, 2008, Pages

  Danis S ^a   Holy V ^a   Stangl, J ^b   Bauer, G ^b  

^a CHARLES UNIVERSITY   (Czech Republic)

^b JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79051469650     PISSN: 02955075     EISSN: 12864854     Source Type: Journal    
DOI: 10.1209/0295-5075/82/66004     Document Type: Article

References (10)

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