The use of low-energy SIMS (LE-SIMS) for nanoscale fuel cell material development

Surface and Interface Analysis

Volumn 43, Issue 1-2, 2011, Pages 635-638

  Morris, R J H ^a   Fearn, S ^b   Perkins, J ^b   Kilner, J ^b   Dowsett, M G ^a   Beigalski, M D ^c   Rouleau, C M ^c  

^a UNIVERSITY OF WARWICK   (United Kingdom)

^b IMPERIAL COLLEGE LONDON   (United Kingdom)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

fuel cells; nanoscale multilayers; SIMS

Indexed keywords

DOPED LAYERS; EPITAXIAL STRUCTURE; FUEL CELL MATERIALS; FUEL CELL TECHNOLOGIES; HIGH RESOLUTION; LOW ENERGIES; LOW OPERATING TEMPERATURE; MATERIAL SYSTEMS; MATRIX STRUCTURE; MECHANICAL STRAIN; MULTILAYER STRUCTURES; NANO SCALE; NANO-METER-SCALE; NANOSCALE MULTILAYERS; NANOSCALE OXIDES; SIMS; SM-DOPED CEO; THERMAL STABILITY; VOLUME CHANGE;

CERIUM; CERIUM COMPOUNDS; CESIUM; DEPTH PROFILING; FUEL CELLS; IONIC CONDUCTIVITY; IONS; NANOSTRUCTURED MATERIALS; OXYGEN; PULSED LASER DEPOSITION; SECONDARY ION MASS SPECTROMETRY;

MULTILAYERS;

EID: 78951492178     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3526     Document Type: Conference Paper

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