Glass-forming exogenous silicon contamination in solid oxide fuel cell cathodes

Electrochemical and Solid-State Letters

Volumn 14, Issue 2, 2011, Pages

  Schuler, J Andreas ^a   Wuillemin, Zacharie ^a   Hessler Wyser, Acha ^a   Van Herle, Jan ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOY COMPONENTS; ENERGY DISPERSIVE X-RAY SPECTROSCOPY; EXOGENOUS SILICON; GLASS-FORMING; HIGHER RESOLUTION; IMPURITY LEVEL; INLET AIR; OXYGEN INCORPORATION; SOLID OXIDE; SPATIALLY RESOLVED;

ENERGY DISPERSIVE SPECTROSCOPY; OXYGEN; SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; SILICON OXIDES; SOLID OXIDE FUEL CELLS (SOFC); TRANSMISSION ELECTRON MICROSCOPY; VAPORS; X RAY SPECTROSCOPY;

AMORPHOUS SILICON;

EID: 78951489052     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3516622     Document Type: Article

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