NanoSIMS50 imaging of thin samples coupled with neutral cesium deposition

Surface and Interface Analysis

Volumn 43, Issue 1-2, 2011, Pages 302-305

  Audinot, Jean Nicolas ^a   Cabin Flaman, Armelle ^b   Philipp, Patrick ^a   Legent, Guillaume ^b   Wirtz, Tom ^a   Migeon, Henri Noel ^a  

^a LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY   (Luxembourg)

^b UNIVERSITÉ DE ROUEN   (France)

Author keywords

nanoSIMS; neutral cesium; pre equilibrium; protein; thin film

Indexed keywords

CESIUM; DEPOSITION; ION BEAMS; PROTEINS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; THIN FILMS;

HIGH IMPACT ENERGY; IMAGING CAPABILITIES; LATERAL RESOLUTION; METHOD OF ANALYSIS; NANOSIMS; ORGANIC THIN FILMS; SECONDARY ION EMISSION; SECONDARY ION YIELD;

ION BOMBARDMENT;

EID: 78951474940     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3550     Document Type: Conference Paper

References (9)

1. G. Mc Mahon, B. J. Blasner, C. P. Lechene, Appl. Surf. Sci. 2006, 252, 6895.
2. J. L. Guerquin-Kern, W. Ting-Di, C. Quintana, A. Croisy, Biochem. Biophys. Acta 2005, 1724, 228.
3. T. Wirtz, H.-N. Migeon, Appl. Surf. Sci. 2004, 231-232C, 940.
4. M. Bernheim, J. Rebière, G. Slodzian, SIMS II Conference, Springer Series in Chemical Physics, Standford, US, 1979, p. 29.
5. P. Philipp, T. Wirtz, H.-N. Migeon, H. Scherrer, Int. J. Mass Spectrom. 2006, 253, 71.
6. P. Philipp, T. Wirtz, H.-N. Migeon, H. Scherrer,. Int. J. of Mass Spectrom. 2006, 264, 70.
7. P. Philipp, J.-N. Audinot, T. Wirtz, H.-N. Migeon, (Neutral Cesium Deposition Prior to SIMS Analysis of Inorganic and Organic Samples), (accepted for publication in Surf. Interface Anal, in press).
8. B. Bendler, R. Barrahma, P. Philipp, T. Wirtz, (New Neutral Cesium Evaporation Chamber and New UHV Suitcase), in these proceedings. Accepted in Surface Interface Analysis, (in press).
9. M. L. Kraft, P. K. Weber, M. L. Longo, I. D. Hutcheon, S. G. Boxe, Science 2006, 313 (5795), 1948.