SCOPUS 정보 검색 플랫폼

Surface and Interface Analysis

Volumn 43, Issue 1-2, 2011, Pages 49-52

Statistics of electron and ion emission from single massive cluster impacts

(6) Verkhoturov, S V a Eller, M J a Della Negra, S b Rickman, R D c Locklear, J E d Schweikert, E A a

a TEXAS A AND M UNIVERSITY (United States)

b 91405 Orsay Campus (France)

c HALLIBURTON (United States)

d Phillips Research Center 224GB (United States)

Author keywords

cluster impact; distribution of ions and electrons; secondary ion emission

Indexed keywords

CLUSTER IMPACT; DISTRIBUTION OF IONS; ELECTRON AND ION EMISSION; ELECTRON ATTACHMENT; ELECTRON EXCHANGE; ELECTRON EXCITATIONS; FUNDAMENTAL CHARACTERISTICS; GRAMICIDIN S; NANOVOLUME; NUMBER OF ELECTRONS; PROJECTILE IMPACT; SECONDARY ION EMISSION; SECONDARY ION MASS SPECTROMETERS; SECONDARY IONS; TIME OF FLIGHT;

AMINO ACIDS; CAMERAS; MASS SPECTROMETRY; NEGATIVE IONS; PROJECTILES; SECONDARY EMISSION;

ELECTRONS;

EID: 78951469034 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.3568 Document Type: Conference Paper

Times cited : (3)

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