Secondary electron emission yields from a CsI surface under impacts of large molecules at low velocities (5 x 103-7 x 104 ms-1)

Rapid Communications in Mass Spectrometry

Volumn 11, Issue 4, 1997, Pages 353-362

  Brunelle, A ^a   Chaurand, P ^a,c   Della Negra, S ^a   Le Beyec, Y ^a   Parilis, E ^b  

^a CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^c HEINRICH HEINE UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DESORPTION; ELECTRONS; MASS SPECTROMETRY; SECONDARY EMISSION;

COINCIDENCE COUNTING; ELECTRON EMISSION YIELDS; EMISSIONS RATES; IONIZATION TECHNIQUES; LOW-VELOCITY; MATRIX ASSISTED LASER DESORPTION IONIZATION; MATRIXASSISTED LASER DESORPTION-IONIZATION (MALDI); MOLECULAR IONS; SECONDARY ELECTRON EMISSIONS; TIME OF FLIGHT MASS SPECTROMETRY;

CESIUM IODIDE;

EID: 0030976728     PISSN: 09514198     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0231(19970228)11:4<353::AID-RCM865>3.0.CO;2-4     Document Type: Article

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