Influence of ambient air exposure on surface chemistry and electronic properties of thin copper phthalocyanine sensing layers

Thin Solid Films

Volumn 519, Issue 7, 2011, Pages 2187-2192

  Grzadziel L ^a   Krzywiecki, M ^a   Peisert, H ^b   Chasse T ^b   Szuber, J ^a  

^a SILESIAN UNIVERSITY OF TECHNOLOGY   (Poland)

^b UNIVERSITY OF TÜBINGEN   (Germany)

Author keywords

Copper phthalocyanine; Electronic properties; Organic semiconductors; Thin films; Ultraviolet photoelectron spectroscopy; X ray photoelectron spectroscopy

Indexed keywords

AMBIENT AIR; COPPER PHTHALOCYANINE; ELECTRONIC PARAMETERS; IONIC SPECIES; NATIVE OXIDES; ORGANIC SEMICONDUCTOR; ORGANIC THIN FILMS; P-TYPE SILICON; SENSING LAYERS; SI(111) SUBSTRATE; SURFACE BAND BENDING; SURFACE DIPOLE; ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY; X RAY PHOTOEMISSION SPECTROSCOPY;

CAPILLARITY; COPPER; ELECTRON AFFINITY; ELECTRONIC PROPERTIES; ELECTRONS; EMISSION SPECTROSCOPY; LUMINESCENCE OF ORGANIC SOLIDS; NITROGEN COMPOUNDS; PHOTOEMISSION; PHOTONS; SILICON; SURFACE CHEMISTRY; SURFACES; THIN FILMS; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY; WORK FUNCTION; X RAYS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 78751641846     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.10.065     Document Type: Article

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