Enhanced figure of merit of a porous thin film of bismuth antimony telluride

Applied Physics Letters

Volumn 98, Issue 2, 2011, Pages

  Kashiwagi, Makoto ^a,b   Hirata, Shuzo ^c   Harada, Kentaro ^a,c   Zheng, Yanqiong ^a,b   Miyazaki, Koji ^a,b   Yahiro, Masayuki ^a,c,d   Adachi, Chihaya ^a,c  

^a Life BEANS Center Kyushu   (Japan)

^b KYUSHU INSTITUTE OF TECHNOLOGY   (Japan)

^c KYUSHU UNIVERSITY   (Japan)

^d Fukuoka Industry Academia Symphonicity   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA SUBSTRATES; AVERAGE DIAMETER; AVERAGE DISTANCE; BISMUTH ANTIMONY TELLURIDE; ELECTRICAL CONDUCTIVITY; FIGURE OF MERIT; FLASH EVAPORATION; PHONON MEAN FREE PATH; POROUS THIN FILMS; ROOM TEMPERATURE;

ANTIMONY; BISMUTH; ELECTRIC CONDUCTIVITY; TELLURIUM COMPOUNDS; THERMAL CONDUCTIVITY; THIN FILMS;

THERMAL CONDUCTIVITY OF SOLIDS;

EID: 78751550625     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3543852     Document Type: Article

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