The water-amorphous silica interface: Analysis of the Stern layer and surface conduction

Journal of Chemical Physics

Volumn 134, Issue 2, 2011, Pages

  Zhang, Hui ^a   Hassanali, Ali A ^a   Shin, Yun Kyung ^a   Knight, Chris ^a,b   Singer, Sherwin J ^a  

^a OHIO STATE UNIVERSITY   (United States)

^b UNIVERSITY OF CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICA; AQUEOUS ELECTROLYTE; CHARGED SURFACES; DOUBLE LAYER SYSTEMS; DYNAMICAL PROPERTIES; EXPERIMENTAL VALUES; INTERFACIAL LAYER; ION MOBILITY; STERN LAYER; STERN MODEL; SURFACE CONDUCTION; SURFACE CONDUCTIVITY;

ELECTRIC CONDUCTIVITY; ELECTROLYTES; SILICA;

IONS;

ELECTROLYTE; SILICON DIOXIDE; WATER;

ARTICLE; CHEMISTRY; ELECTRIC CONDUCTIVITY; MOLECULAR DYNAMICS; SURFACE PROPERTY;

ELECTRIC CONDUCTIVITY; ELECTROLYTES; MOLECULAR DYNAMICS SIMULATION; SILICON DIOXIDE; SURFACE PROPERTIES; WATER;

EID: 78751531294     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3510536     Document Type: Article

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