Effect of primary filter using theoretical intensity of fluorescent X-rays and scattered X-rays

X-Ray Spectrometry

Volumn 39, Issue 6, 2010, Pages 399-406

  Ogawa, R ^a   Ochi, H ^a   Nishino, M ^a   Ichimaru, N ^b   Yamato, R ^b  

^a SHIMADZU CORPORATION   (Japan)

^b Shimadzu Analytical and Measuring Center Inc 1   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BANDPASS FILTERS; ENERGY DISPERSIVE SPECTROSCOPY; FLUORESCENCE;

CONCENTRATION ANALYSIS; ENERGY DISPERSIVE X-RAY FLUORESCENCE; FILTER MATERIALS; FLUORESCENT X-RAYS; LOW CONCENTRATIONS; NICKEL MOLYBDENUM; NICKEL-TITANIUM; SCATTERED X-RAYS; TITANIUM ALUMINUM; X-RAY FLUORESCENCE SPECTROMETER;

ZIRCONIUM;

EID: 78751507940     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.1284     Document Type: Article

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