Microstructure changes during non-conventional heat treatment of thin Ni-Ti wires by pulsed electric current studied by transmission electron microscopy

Acta Materialia

Volumn 58, Issue 13, 2010, Pages 4503-4515

  Delville, R ^a   Malard, B ^b,c   Pilch, J ^b   Sittner, P ^b   Schryvers, D ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b INSTITUTE OF PHYSICS   (Czech Republic)

^c UNIV GRENOBLE ALPES   (France)

Author keywords

Annealing; Nanocrystalline microstructure; Recrystallization; Shape memory alloys (SMA); Transmission electron microscopy (TEM)

Indexed keywords

ANNEALING; CRYSTALLIZATION; ELECTRON MICROSCOPY; HEAT TREATMENT; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MECHANICAL TESTING; MICROSTRUCTURAL EVOLUTION; MICROSTRUCTURE; NANOCRYSTALLINE ALLOYS; NANOCRYSTALS; NICKEL; RECRYSTALLIZATION (METALLURGY); SHAPE MEMORY EFFECT; STAINLESS STEEL; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRICAL RESISTIVITY MEASUREMENTS; MICROSTRUCTURE CHANGES; NANOCRYSTALLINE MICROSTRUCTURES; NANOGRAINED MICROSTRUCTURE; PULSED ELECTRIC CURRENT; RECOVERY AND RECRYSTALLIZATION; SHAPE MEMORY ALLOYS(SMA); SUPER-ELASTIC PROPERTY;

CRYSTAL MICROSTRUCTURE;

EID: 78651406077     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2010.04.046     Document Type: Article

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