Low-loss microwave dielectrics using (Mg1-xZnx) 4Nb2O9 (x = 0.02-0.08) solid solutions

Journal of Alloys and Compounds

Volumn 509, Issue 5, 2011, Pages 2269-2272

  Huang, Cheng Liang ^a   Yang, Wen Ruei ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Crystal growth; Dielectric response

Indexed keywords

DIELECTRIC CONSTANTS; DIELECTRIC RESPONSE; EDS ANALYSIS; LATTICE PARAMETERS; LOW LOSS; MICROWAVE DIELECTRIC PROPERTIES; MICROWAVE DIELECTRICS; PURE MG; SOLID SOLUTION SYSTEM; SOLID-STATE ROUTES; TEMPERATURE COEFFICIENT OF RESONANT FREQUENCY;

CERAMIC MATERIALS; CRYSTAL GROWTH; CRYSTALLIZATION; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; DIFFRACTION; LATTICE CONSTANTS; NATURAL FREQUENCIES; SINTERING; SOLIDIFICATION; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC;

SOLID SOLUTIONS;

EID: 78651371998     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.10.201     Document Type: Article

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