High-Q microwave dielectrics in the (Mg1-xCox) 2TiO4 ceramics

Journal of the American Ceramic Society

Volumn 92, Issue 2, 2009, Pages 379-383

  Huang, Cheng Liang ^a   Chen, Jhih Yong ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC CAPACITORS; CERAMIC MATERIALS; DIELECTRIC MATERIALS; DIFFRACTION; HOLOGRAPHIC INTERFEROMETRY; LATTICE CONSTANTS; MICROWAVES; OXIDE MINERALS; SOLID SOLUTIONS; X RAY DIFFRACTION ANALYSIS;

ENERGY DISPERSIVE X-RAY ANALYSIS; LATTICE PARAMETERS; LOW LOSS; MICROWAVE DIELECTRIC PROPERTIES; MICROWAVE DIELECTRICS; MILLIMETER-WAVE APPLICATIONS; PROCESS WINDOWS; SECOND PHASE; SOLID-STATE ROUTES; X-RAY DIFFRACTION PATTERNS;

DIELECTRIC PROPERTIES;

EID: 60849138384     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2008.02742.x     Document Type: Article

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