Application of grey prediction model for failure prognostics of electronics

International Journal of Performability Engineering

Volumn 6, Issue 5, 2010, Pages 435-442

  Gu, Jie ^a   Vichare, Nikhil ^b   Ayyub, Bilal ^c   Pecht, Michael ^c,d  

^a UNIVERSITY OF MARYLAND   (United States)

^b DELL INC   (United States)

^c UNIVERSITY OF MARYLAND   (United States)

^d CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Electronics; Failure prediction; Grey prediction models; Prognostics

Indexed keywords

BALL GRID ARRAYS; ELECTRONIC EQUIPMENT; SOLDERED JOINTS; SYSTEM THEORY; SYSTEMS ENGINEERING;

DATA-DRIVEN METHODS; ELECTRONIC BOARDS; ELECTRONICS COMPONENTS; FAILURE PREDICTION; FAILURE PROGNOSTICS; GREY PREDICTION MODEL; PROGNOSTICS; RELIABILITY PREDICTION;

FORECASTING;

EID: 78651366686     PISSN: 09731318     EISSN: 29938341     Source Type: Journal    
DOI: None     Document Type: Article

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