A new shorted microstrip method to determine the complex permeability of thin films

IEEE Transactions on Magnetics

Volumn 46, Issue 3 PART 2, 2010, Pages 886-888

  Wu, Yunqiu ^a   Tang, Zongxi ^a   Xu, Yuehang ^a   Zhang, Biao ^a   He, Xi ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

Complex permeability; Microwave measurement; Thin film

Indexed keywords

COMPLEX PERMEABILITY; CONFORMAL MAPPING METHOD; FERROMAGNETIC THIN FILMS; MICROSTRIPES; RIGID SUBSTRATES; TRANSMISSION-LINE;

CONFORMAL MAPPING; FERROMAGNETIC MATERIALS; FERROMAGNETISM; SATURATION MAGNETIZATION;

THIN FILMS;

EID: 78651242390     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2009.2030886     Document Type: Article

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