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Volumn 241, Issue 2, 2011, Pages 179-187

New method for characterizing paper coating structures using argon ion beam milling and field emission scanning electron microscopy

Author keywords

Argon ion beam milling; Coating uniformity; Field emission scanning electron microscopy; Image analysis; Marker controlled watershed segmentation; Paper

Indexed keywords

BACKSCATTERING; BINDERS; COATINGS; ELECTRON SCATTERING; ELECTRONS; FIELD EMISSION; IMAGE ANALYSIS; IONS; MILLING (MACHINING); POROSITY; QUALITY CONTROL; SCANNING ELECTRON MICROSCOPY; SECONDARY EMISSION;

EID: 78651232833     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2010.03418.x     Document Type: Article
Times cited : (21)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.