Sample preparation method for printed paper cross-sections using a focused ion beam

Proceedings of the International Printing and Graphic Arts Conference

Volumn , Issue , 1998, Pages 121-124

  Uchimura, Hiromi ^a   Ozaki, Yasushi ^a   Kimur, Minoru ^a  

^a Ministry of Finance   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HARDNESS; INK; ION BEAMS; ION BOMBARDMENT;

FOCUSED ION BEAMS (FIB);

PRINTING PROPERTIES;

EID: 0032306433     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)