An improved approach to quantitative X-ray microanalysis in (S)TEM: Thickness dependent k-factors

Journal of Physics: Conference Series

Volumn 241, Issue , 2010, Pages

  Walther, T ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING INDIUM; TRANSMISSION ELECTRON MICROSCOPY;

ABSORPTION CORRECTIONS; CHEMICAL CONCENTRATIONS; ENERGY DISPERSIVE X-RAY; LINEAR LEAST SQUARES; RELATIVE INTENSITY; SPECIMEN THICKNESS; THICKNESS DEPENDENCE; X-RAY MICROANALYSIS;

FLUORESCENCE;

EID: 78651090532     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/241/1/012016     Document Type: Conference Paper

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