A simple method to improve the quantification accuracy of energy-dispersive X-ray microanalysis

Journal of Physics: Conference Series

Volumn 126, Issue , 2008, Pages

  Walther, T ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 65649138802     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/126/1/012090     Document Type: Article

References (10)

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4. Reed SJB 1965 Brit. J. Appl. Phys. 16 13
5. Bastin GF, Dijkstra JM and Heijligers HJM 1998 X-ray Spectrom 27 3
6. Goldstein JI, Costley JL, Lorimer GW and Reed SJB 1977 Quantitative X-ray Analysis in the Electron Microscope Scanning Electr. Microsc: Proc. Workshop Anal. Electron Microsc ed 0 Johari (IIT Research Institute, Chicago, IL, USA, March 1977, vol I) p 315
7. Crozier PA, Catalano M and Cingolani R 2003 Ultramicroscopy 94 1
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