Noise mechanisms in small grain size perpendicular thin film media

IEEE Transactions on Magnetics

Volumn 47, Issue 1 PART 1, 2011, Pages 74-80

  Zhu, Jian Gang ^a   Sokalski, Vincent ^a   Wang, Yiming ^a   Laughlin, David E ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Magnetic recording; medium noise; PMR media; stacking faults; thin film media

Indexed keywords

ANISOTROPY; COBALT ALLOYS; COMPOSITE FILMS; EXCHANGE COUPLING; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MAGNETIC RECORDING; SIGNAL TO NOISE RATIO; SILICON; STACKING FAULTS; TEXTURES;

EXPERIMENTAL INVESTIGATIONS; EXPONENTIAL DEPENDENCE; INTER-GRANULAR EXCHANGE COUPLINGS; MEDIUM NOISE; PERPENDICULAR ANISOTROPY; PMR MEDIA; SWITCHING FIELD REDUCTION; THIN FILM MEDIA;

THIN FILMS;

EID: 78651079818     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2010.2076330     Document Type: Article

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