Semi-quantitative evaluation of stacking faults in pseudo-hcp thin films by laboratory-scale in-plane x-ray diffraction

Journal of Physics D: Applied Physics

Volumn 42, Issue 14, 2009, Pages

  Saito, Shin ^a   Hashimoto, Atsushi ^a   Hasegawa, Daiji ^a   Takahashi, Migaku ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSOLUTE VALUES; ALLOY FILM; ATOMIC LAYER; ATOMIC SCATTERING; CO FILMS; COPT ALLOYS; IN-PLANE; INTENSITY RATIO; LABORATORY SCALE; LAYERED STRUCTURES; LORENTZ; PSEUDO-HCP; SEMI-QUANTITATIVE; SPUTTERED THIN FILMS; STACKING ORDER; STRUCTURE FACTORS; THEORETICAL VALUES; X RAY DIFFRACTOMETERS;

ALLOYING ELEMENTS; CHROMIUM; COBALT; DIFFRACTION; IRIDIUM; LATTICE CONSTANTS; METALLIC FILMS; PLATINUM; PLATINUM ALLOYS; PROBABILITY DENSITY FUNCTION; THIN FILMS; X RAY DIFFRACTION;

STACKING FAULTS;

EID: 70149103322     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/42/14/145007     Document Type: Article

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