Nanometric resolution using far-field optical tomographic microscopy in the multiple scattering regime

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 82, Issue 6, 2010, Pages

  Girard, Jules ^a   Maire, Guillaume ^a   Giovannini, Hugues ^a   Talneau, Anne ^b   Belkebir, Kamal ^a   Chaumet, Patrick C ^a   Sentenac, Anne ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; DIFFRACTION LIMITED; DIFFRACTIVE PROPERTIES; FAR-FIELD; FUNDAMENTAL LIMITS; INVERSION ALGORITHM; NANOMETRIC RESOLUTION; TOMOGRAPHIC;

MULTIPLE SCATTERING;

EID: 78650990180     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.82.061801     Document Type: Article

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