Complex source beam: A tool to describe highly focused vector beams analytically

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 82, Issue 6, 2010, Pages

  Orlov, S ^a,b   Peschel, U ^b  

^a MAX PLANCK INSTITUTE FOR THE SCIENCE OF LIGHT   (Germany)

^b UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL EXPRESSIONS; BEAM WIDTHS; CIRCULARLY POLARIZED; EQUATION SOLUTION; FOCUSED BEAMS; FOCUSING SYSTEM; HIGH NA; PARAMETER SET; SOURCE MODELS; SPATIAL EXTENT;

MAXWELL EQUATIONS;

EID: 78650969561     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.82.063820     Document Type: Article

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