Fabrication and characterization of SMA/PZT thin film heterostructures

AIP Conference Proceedings

Volumn 1313, Issue , 2010, Pages 90-93

  Choudhary, Nitin ^a   Kaur, Davinder ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY ROORKEE   (India)

Author keywords

Electrical properties; NiTi PZT heterostructure; Sputtering

Indexed keywords

EID: 78650897864     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3530575     Document Type: Conference Paper

References (5)

1. J.-M. Zhang, F. Ma, K.-W. Xu, Surf. Interface Anal. 35 662 (2003).
2. B.D. Cullity, Elements of X-ray Diffraction, Addison-Wesley, Reading, MA, 1970.
3. R. Banerjee, E.A. Sperling, G.B. Thompson, H.L. Fraser, S. Bose, P. Ayyub, Appl. Phys. Lett. 82, 4250 (2003).
4. A. Kumar, D. Kaur, D. Singh, Surf. Coat. Technol. 203 1596 (2009).
5. F.E. Wang, S.J. Pickart, H.A. Alperin, J. Appl. Phys. 43 97 (1972).