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Volumn , Issue , 2010, Pages 1577-1580

A device for vacuum drying, inert gas backfilling and solder sealing of hermetic implant packages

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC CIRCUITS; IMPLANTED DEVICE; MOISTURE PROTECTION; OPERATION PROCEDURE; RESIDUAL MOISTURE; VACUUM DRYING;

EID: 78650838681     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEMBS.2010.5626688     Document Type: Conference Paper
Times cited : (9)

References (4)
  • 3
    • 78650815723 scopus 로고    scopus 로고
    • Dryness and hermeticity of sealed enclosures
    • ASM International
    • G. Humpston and D.M. Jacobson: "Dryness and Hermeticity of Sealed Enclosures" in Principles of Soldering, ASM International, pp. 184-187, 2004.
    • (2004) Principles of Soldering , pp. 184-187
    • Humpston, G.1    Jacobson, D.M.2
  • 4
    • 78650832084 scopus 로고    scopus 로고
    • Understanding helium fine leak testing in accordance with method 1014, MIL-STD-883
    • Ed. H. Greenhouse, Noyes Publications
    • H. Greenhouse: "Understanding Helium Fine Leak Testing in Accordance with Method 1014, MIL-STD-883" in Hermeticity of Electronic Packages, Ed. H. Greenhouse, Noyes Publications, pp, 196-244, 2000.
    • (2000) Hermeticity of Electronic Packages , pp. 196-244
    • Greenhouse, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.